Three ECE faculty, Navid Asadi, Domenic Forte, and Mark Tehranipoor, were among the authors recently awarded the Best Paper Award at the 43rd International Symposium for Testing and Failure Analysis (ISTFA), held Nov. 5-9 in Pasadena, California. Their presentation was entitled “Steps Toward Automated Deprocessing of Integrated Circuits,” and was co-authored by E.L. Principe, Robert Chivas, Michael DiBattista, Scott Silverman, Mike Marsh, Nicolas Piche, and John Mastovich.
As part of the award, all authors will be honored with an award at ISTFA 2018, to be held in Phoenix, AZ, Oct. 26 through Nov. 1, 2018. Recognition will also be given in the 2018 ISTFA final program and proceedings. Additionally, as the ISTFA 2017 Outstanding Paper winner, the authors are given the opportunity to present at the 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2018, Oct. 1-5, 2018, Aalborg, Denmark.