ECE PhD student Ulbert (Joey) Botero was recently awarded 2020 Outstanding Paper at the Electronic Device Failure Analysis Society (EDFAS) Virtual Workshop, held December 7–9 of last year for his paper, “Automated Via Detection for PCB Reverse Engineering.” EDFAS is one of the leading societies of ASM International (formerly known as the American Society for Metals), a professional organization for materials scientists and engineers.

As presenting author of the 2020 Outstanding Paper, Botero will be honored at the 2021 International Symposium for Testing and Failure Analysis (ISTFA), which will be held in Phoenix, Oct. 31-Nov. 4, 2021. Recognition will also be given in the 2021 ISTFA final program and proceedings. Additionally, as the EDFAS Virtual Workshop 2020 Outstanding Paper winner, Botero will be given the opportunity to present at the 32nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), to be held virtually October 4–8, 2021.

Botero is advised by Dr. Domenic Forte and is a research assistant at the Florida Institute for Cybersecurity (FICS) Research as well as an NSF-GRFP fellow. His research interests include: wearable technology, biometrics, machine learning, computer vision, hardware trust and assurance, and reverse engineering.