Tag: AiatUF

Forte & Maghari Invent “Universal Testing Technique” to Detect Counterfeit Chips

An article recently published in the Academic Times profiled exciting new technology patented by researchers at the Florida Institute for Cybersecurity (FICS) Research which promises a new way to detect recycled and counterfeit electronic parts. The technology created by ECE Associate Professor Domenic Forte and ECE Associate Professor Nima Maghari makes supply chains more secure, protects consumer safety and runs at almost zero cost.